Plan-View Preparation of TEM Specimens from Thin Films Using Adhesive Tape
نویسندگان
چکیده
منابع مشابه
Preparation of plan-view Co-doped FeSi thin film TEM specimens using FIB
When examining thin films using transmission electron microscopy (TEM), it is usually necessary to image a cross-section of the film (i.e. parallel to the film). However sometimes it is favourable to image thin films in plan-view (i.e. perpendicular to the film). This is the case for Co-doped FeSi thin films, which possess chiral symmetry along certain zone axes. In order to view these zone axe...
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چکیده ندارد.
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Preparation of Gallium Arsenide (GaAs) surfaces, prior to a thin-film deposition, serves the prevailing functions of lowering defectivity, contamination removal and promoting adhesion. When native oxides, metallics or particulates are a concern, the common GaAs clean includes a dilute acid (HCl, HF) or base (NH4OH). When adhesion is the primary concern, the GaAs surface may need to be roughened...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2011
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927611012086